GlobalSpec.com: Microelectronics Measurement
Provides database of suppliers for microelectronics measurement. Includes catalogs, technical information, and supplier contact information.
test-equipment.globalspec.com
Provides database of suppliers for microelectronics measurement. Includes catalogs, technical information, and supplier contact information.
test-equipment.globalspec.com
Microelectronics Industry
Industry Research Reports with Trends, Forecasts & Analysis
MarketResearch.com/Microelectronics
Industry Research Reports with Trends, Forecasts & Analysis
MarketResearch.com/Microelectronics
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Web Listings
Microelectronics Reliability : Measurement and analysis of contact ...
Microelectronics Reliability · Volume 47, Issue 7, July 2007, Pages 1086-1094 ... Measurement and analysis of contact resistance in wafer probe testing ...
http://linkinghub.elsevier.com/retrieve/pii/S0026271406003015
Microelectronics Reliability · Volume 47, Issue 7, July 2007, Pages 1086-1094 ... Measurement and analysis of contact resistance in wafer probe testing ...
http://linkinghub.elsevier.com/retrieve/pii/S0026271406003015
Microelectronics Reliability : Analysis of the gate capacitance ...
A simulation of the Qot extraction measurement was carried out using the device simulator MEDICI. Both Qot (oxide interface ...
http://linkinghub.elsevier.com/retrieve/pii/S0026271400002225
A simulation of the Qot extraction measurement was carried out using the device simulator MEDICI. Both Qot (oxide interface ...
http://linkinghub.elsevier.com/retrieve/pii/S0026271400002225
Abstracts: Test and measurement. Logic comes to the rescue ...
Instruments to measure electricity, Circuit design, Product introduction, Microelectronics, Business conditions, Trends, Industry Analysis, Measurement, ...
http://www.faqs.org/abstracts/Engineering-and-manufacturing-industries/Test-and-meas...
Instruments to measure electricity, Circuit design, Product introduction, Microelectronics, Business conditions, Trends, Industry Analysis, Measurement, ...
http://www.faqs.org/abstracts/Engineering-and-manufacturing-industries/Test-and-meas...
ntel Education: Intel® Higher Education Program Curriculum Forum ...
The courses' topics focus on the microelectronics assembly and packaging .... 2) Measurement capability analysis for measurement system development and ...
http://www.intel.com/education/highered/curriculum/packaging.htm
The courses' topics focus on the microelectronics assembly and packaging .... 2) Measurement capability analysis for measurement system development and ...
http://www.intel.com/education/highered/curriculum/packaging.htm
Line-width measurements of metallization coated with insulator on ...
US Patent 5414265 - Line-width measurements of metallization coated with insulator on microelectronic circuits using energy dispersive x-ray analysis ...
http://www.patentstorm.us/patents/5414265/description.html
US Patent 5414265 - Line-width measurements of metallization coated with insulator on microelectronic circuits using energy dispersive x-ray analysis ...
http://www.patentstorm.us/patents/5414265/description.html
Nikon Instruments Inc. | Applications | Industrial | Precision ...
Industrial · Precision Measurement; Microelectronics ... for wafer inspection; and video measuring systems for detailed metrology analysis and reporting; ...
http://www.nikoninstruments.com/Applications/Industrial/Precision-Measurement/Microe...
Industrial · Precision Measurement; Microelectronics ... for wafer inspection; and video measuring systems for detailed metrology analysis and reporting; ...
http://www.nikoninstruments.com/Applications/Industrial/Precision-Measurement/Microe...
Analysis of metrological and service characteristics of ...
BIOMEDICAL MEASUREMENTS. ANALYSIS OF METROLOGICAL AND SERVICE CHARACTERISTICS. OF MICROELECTRONIC QRS DETECTORS. B. I. Podlepetskii and S. V. Torubarov ...
http://www.springerlink.com/index/G0070TTQ51307762.pdf
BIOMEDICAL MEASUREMENTS. ANALYSIS OF METROLOGICAL AND SERVICE CHARACTERISTICS. OF MICROELECTRONIC QRS DETECTORS. B. I. Podlepetskii and S. V. Torubarov ...
http://www.springerlink.com/index/G0070TTQ51307762.pdf
MICROELECTRONIC TEST STRUCTURES 1. Introduction 2. Resistivity ...
A close analysis of the spatial distribution of ..... level reliability measurements of thin dielectrics'', Microelectronics and Reliability, vol. 33, no. ...
http://www.see.ed.ac.uk/research/IMNS/papers/micro_test.pdf
A close analysis of the spatial distribution of ..... level reliability measurements of thin dielectrics'', Microelectronics and Reliability, vol. 33, no. ...
http://www.see.ed.ac.uk/research/IMNS/papers/micro_test.pdf
Backside Analysis of Ultra-Thin Film Stacks in Microelectronics ...
down-scaling of layer thicknesses in microelectronics technology poses big .... measurement takes 12 h. Figure 5. Backside XPS analysis: XPS mapping of Hf ...
http://www.mrs.org/s_mrs/bin.asp?CID=18405&DID=243556&DOC=FILE.PDF
down-scaling of layer thicknesses in microelectronics technology poses big .... measurement takes 12 h. Figure 5. Backside XPS analysis: XPS mapping of Hf ...
http://www.mrs.org/s_mrs/bin.asp?CID=18405&DID=243556&DOC=FILE.PDF
UWA Microelectronics Research Group - Facilities
Automatic, variable magnetic field (0-2T) Hall system allowing for magnetic field dependent Hall data measurement and analysis. ...
http://mrg.ee.uwa.edu.au/facilities.php
Automatic, variable magnetic field (0-2T) Hall system allowing for magnetic field dependent Hall data measurement and analysis. ...
http://mrg.ee.uwa.edu.au/facilities.php
Infrared spectroscopy - Wikipedia, the free encyclopedia
Fourier transform infrared (FTIR) spectroscopy is a measurement technique for collecting ... Main article: Two-dimensional infrared spectroscopy correlation analysis ... Infrared characterization for microelectronics. World Scientific. ...
http://en.wikipedia.org/wiki/Infrared_spectroscopy
Fourier transform infrared (FTIR) spectroscopy is a measurement technique for collecting ... Main article: Two-dimensional infrared spectroscopy correlation analysis ... Infrared characterization for microelectronics. World Scientific. ...
http://en.wikipedia.org/wiki/Infrared_spectroscopy
Coherent Inc. : Microelectronics
Spectral Analysis · Custom Measurement and Control Solutions ... Coherent supplies lasers to four major markets in the microelectronics industry: ...
http://www.coherent.com/Company/index.cfm?fuseaction=Forms.page&PageID=63
Spectral Analysis · Custom Measurement and Control Solutions ... Coherent supplies lasers to four major markets in the microelectronics industry: ...
http://www.coherent.com/Company/index.cfm?fuseaction=Forms.page&PageID=63
Scatterometry Applied to Microelectronics Processing
Recent scatterometry measurement data from metal layers will be presented; ... The analysis involved comparing the measured data to a library of theoretical ...
http://www.ieee.org/organizations/pubs/newsletters/leos/oct00/scatter.htm
Recent scatterometry measurement data from metal layers will be presented; ... The analysis involved comparing the measured data to a library of theoretical ...
http://www.ieee.org/organizations/pubs/newsletters/leos/oct00/scatter.htm
Warpage Measurement on Dielectric Rough Surfaces of ...
... is proposed as a tool for warpage measurement of microelectronics devices. ... The result of the numerical analysis defined the contour interval of the ...
http://link.aip.org/link/?JEPAE4/122/227/1
... is proposed as a tool for warpage measurement of microelectronics devices. ... The result of the numerical analysis defined the contour interval of the ...
http://link.aip.org/link/?JEPAE4/122/227/1
Study of Stress in Microelectronic Materials by Photoelasticity
... photoelastic stress analysis in microelectronic materials and devices, ranged from theoretical study to practical system setup, from measurement methods ...
http://adsabs.harvard.edu/abs/1996PhDT........25L
... photoelastic stress analysis in microelectronic materials and devices, ranged from theoretical study to practical system setup, from measurement methods ...
http://adsabs.harvard.edu/abs/1996PhDT........25L
A Historical Perspective on TXRF Applications for Microelectronics ...
A Historical Perspective on TXRF Applications for Microelectronics ... TXRF analysis W-M beam analysis Aluminum measurement. Overlap with Si, Br, As ...
http://fcs.itc.it/events/download/TXRF2007_contributions.pdf
A Historical Perspective on TXRF Applications for Microelectronics ... TXRF analysis W-M beam analysis Aluminum measurement. Overlap with Si, Br, As ...
http://fcs.itc.it/events/download/TXRF2007_contributions.pdf
Analysis and Simulation of Heterostructure Devices (Computational ...
Analysis and Simulation of Heterostructure Devices (Computational Microelectronics) Used, $176.50, N.C., $176.50, Usually s. ...
http://www.wikio.com/books/analysis-and-simulation-of-heterostructure-devices-comput...
Analysis and Simulation of Heterostructure Devices (Computational Microelectronics) Used, $176.50, N.C., $176.50, Usually s. ...
http://www.wikio.com/books/analysis-and-simulation-of-heterostructure-devices-comput...
Agilent | Agilent Technologies and Fujitsu Microelectronics ...
Oct 24, 2007 ... Business Newsrooms. Life Sciences & Chemical Analysis · Electronic Measurement ... About Fujitsu Microelectronics Pacific Asia Ltd. ...
http://www.agilent.com/about/newsroom/presrel/2007/24oct-em07174.html
Oct 24, 2007 ... Business Newsrooms. Life Sciences & Chemical Analysis · Electronic Measurement ... About Fujitsu Microelectronics Pacific Asia Ltd. ...
http://www.agilent.com/about/newsroom/presrel/2007/24oct-em07174.html
Leading Microelectronics Failure Analysis Event Comes to San Jose ...
Jul 15, 2009 ... Size Analysis, Zeta Potential and Molecular Weight Measurement – Malvern ... The leading event for the microelectronics failure analysis ...
http://www.azom.com/news.asp?NewsID=18073
Jul 15, 2009 ... Size Analysis, Zeta Potential and Molecular Weight Measurement – Malvern ... The leading event for the microelectronics failure analysis ...
http://www.azom.com/news.asp?NewsID=18073
Microelectronics Market Research Reports: Microelectronics ...
Competitive market analysis of the RLG, FOG, DTG, Quartz and MEMS based Inertial Measurement Units Get Yole's unique global and in-depth view of the IMU ...
http://www.marketresearch.com/browse.asp?categoryid=323&sortby=d&g=1&page=2
Competitive market analysis of the RLG, FOG, DTG, Quartz and MEMS based Inertial Measurement Units Get Yole's unique global and in-depth view of the IMU ...
http://www.marketresearch.com/browse.asp?categoryid=323&sortby=d&g=1&page=2
Microelectronics Industry
Industry Research Reports with Trends, Forecasts & Analysis
MarketResearch.com/Microelectronics
Industry Research Reports with Trends, Forecasts & Analysis
MarketResearch.com/Microelectronics
GlobalSpec.com: Microelectronics Measurement
Provides database of suppliers for microelectronics measurement. Includes catalogs, technical information, and supplier contact information.
test-equipment.globalspec.com
Provides database of suppliers for microelectronics measurement. Includes catalogs, technical information, and supplier contact information.
test-equipment.globalspec.com
