Rudolph Technologies Inc. - RTEC- Profile

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Website: http://www.rudolphtech.com

Phone: +1 973 691-1300
Address:
One Rudolph Road
Flanders, NEW JERSEY 07836

Company Description
Rudolph Technologies Incorporated. The Group's principal activity is to design, develop and manufacture high-performance process control metrology and defect inspection systems used in semiconductor device manufacturers. The Group provides full-fab solutions through a family of stand-alone systems and integrated modules for both transparent and opaque thin film measurements and macro-defect detection. The Group's thin film measurement proprietary systems measure the thickness and other properties of thin films applied during various steps in the manufacture of integrated circuits, enabling semiconductor device manufacturers to improve yields and reduce overall production costs. Also includes macro-defect inspection proprietary systems detect and classify defects in semiconductor wafers. The Group's system support in variety of applications in diffusion, etch, lithography, CVD, PVD, CMP and macro-defect detection.On 15-Feb-2006 The Group completed the merger with August Technology Corp. Design, develop and manufacture high-performance process control metrology systems used in semiconductor device manufacturers
Key People
Chairman & Chief Executive Paul F. McLaughlin
Senior Vice President, Chief Financial Officer & Secretary Steven R. Roth

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Rudolph Technologies
Manufacturer of film thickness metrology equipment serving the semiconductor device industry.
www.rudolphtech.com
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Measure Film Thickness
Measure films 1nm to 1mm thick in seconds. Non-contact.
www.filmetrics.com

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